Allendale, NJ, United States of America

John Gregory Hannes


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: The Innovations of John Gregory Hannes

Introduction

John Gregory Hannes is a notable inventor based in Allendale, NJ, recognized for his contributions to the field of technology. With a passion for innovation, he has developed a distinct invention that showcases his skills in creating advanced tools for better functionality in electronic devices.

Latest Patents

Among his innovations is a single patent for a "Context Sensitive Toolbar." This invention details an oscilloscope apparatus featuring a display that showcases a variety of objects. The patent outlines a user interface that allows users to select specific objects, with the display presenting various functions on the toolbar that correspond to the selected object, enhancing user interaction and efficiency.

Career Highlights

John Gregory Hannes has made significant strides in his career as an inventor. He is currently associated with LeCroy Corporation, a prominent company known for its electronic test and measurement equipment. His innovative approach has contributed to the development of crucial technologies within the organization.

Collaborations

Throughout his career, John has had the opportunity to collaborate with talented individuals, including coworkers Lawrence Steven Salant and Anthony R Cake. Together, they have worked towards achieving advancements in technology and enhancing the overall user experience in their products.

Conclusion

John Gregory Hannes stands out as a dedicated inventor whose work continues to impact the field of technology. His patent for the context-sensitive toolbar exemplifies his innovative spirit and commitment to improving electronic devices. As he continues his journey at LeCroy Corporation, his contributions will undoubtedly lead to further advancements in the realm of electronic measurement and analysis.

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