Wrentham, MA, United States of America

John Dwinell

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Sick Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Dwinell. Retrieved from https://idiyas.com/inventor/john-dwinell

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

 

Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 143(Granted Patents)


Company Filing History:


Years Active: 2012

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2 patents (USPTO):Explore Patents

Title: John Dwinell: Innovator in Image Quality Analysis and Parcel Dimensioning

Introduction

John Dwinell is a notable inventor based in Wrentham, MA (US). He has made significant contributions to the fields of image quality analysis and parcel dimensioning. With a total of 2 patents to his name, Dwinell continues to push the boundaries of technology through his innovative ideas.

Latest Patents

Dwinell's latest patents include a system for image quality analysis with a test pattern. This system automates the analysis of image quality obtained by a camera in a camera tunnel system. It features a test pattern on an item placed in the camera tunnel system and an imaging subsystem that captures an image of the item. The image includes the test pattern, and an image analysis tool is configured to automatically identify and analyze the image for generating one or more image quality metrics.

Another significant patent is the parcel dimensioning measurement system and method. This system includes image sensors that are oriented to image a parcel. An imaging subsystem stitches together the outputs of the image sensors to produce at least one two-dimensional image comprised of a plurality of pixels. The system also includes a general dimension subsystem with general parcel dimension information, and a fine dimensioning subsystem that determines dimension measurements of the parcel using the two-dimensional image and the general parcel dimension information.

Career Highlights

Dwinell is currently employed at Sick Inc., where he applies his expertise in developing innovative solutions. His work has been instrumental in enhancing the efficiency and accuracy of image analysis and parcel measurement systems.

Collaborations

Dwinell collaborates with Long Xiang Bian, contributing to the advancement of technology in their respective fields.

Conclusion

John Dwinell is a prominent inventor whose work in image quality analysis and parcel dimensioning has made a significant impact. His innovative patents reflect his commitment to advancing technology and improving industry standards.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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