The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2012

Filed:

Apr. 20, 2007
Applicants:

John Dwinell, Wrentham, MA (US);

Long Xiang Bian, Sharon, MA (US);

Inventors:

John Dwinell, Wrentham, MA (US);

Long Xiang Bian, Sharon, MA (US);

Assignee:

Sick, Inc., Minneapolis, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for the automated analysis of image quality obtained by a camera in a camera tunnel system includes a test pattern on an item for placement in the camera tunnel system and an imaging subsystem configured to capture an image of the item using the camera tunnel system, wherein the image includes an image of the test pattern. The system further includes an image analysis tool configured to automatically identify and analyze the image of the test pattern for generating one or more image quality metrics.


Find Patent Forward Citations

Dwinell, John. (2012). Image quality analysis with test pattern (U.S. Patent No. 8139117). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8139117

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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