Company Filing History:
Years Active: 2005-2012
Title: Innovations of Long Xiang Bian
Introduction
Long Xiang Bian is an accomplished inventor based in Sharon, MA (US). He holds a total of 5 patents that showcase his expertise in image quality analysis and parcel dimensioning measurement systems. His innovative contributions have significantly impacted the fields of imaging technology and automated measurement systems.
Latest Patents
One of his latest patents is focused on image quality analysis with a test pattern. This system automates the analysis of image quality obtained by a camera in a camera tunnel system. It includes a test pattern on an item for placement in the camera tunnel system and an imaging subsystem that captures an image of the item. The image includes the test pattern, and the system features an image analysis tool that automatically identifies and analyzes the image of the test pattern to generate various image quality metrics.
Another notable patent is the parcel dimensioning measurement system and method. This system comprises image sensors oriented to image a parcel and an imaging subsystem that stitches together outputs of the image sensors to produce at least one two-dimensional image. The system also includes a general dimension subsystem with general parcel dimension information and a fine dimensioning subsystem that determines dimension measurements of the parcel using the two-dimensional image and the general parcel dimension information.
Career Highlights
Throughout his career, Long Xiang Bian has worked with reputable companies such as Sick Auto Ident, Inc. and Sick Inc. His work in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in technology.
Collaborations
Some of his notable coworkers include Walter P. Sweeney, Jr. and John Dwinell. Their collaboration has likely fostered an environment of creativity and innovation, leading to the development of impactful technologies.
Conclusion
Long Xiang Bian's contributions to the fields of image quality analysis and parcel dimensioning measurement systems highlight his innovative spirit and technical expertise. His patents reflect a commitment to advancing technology and improving automated systems.