Longmont, CO, United States of America

John Douglas Deibert

This inventor holds 1 USPTO granted patent. Top assignee: Seagate Technology Incorporated. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Douglas Deibert. Retrieved from https://idiyas.com/inventor/john-douglas-deibert

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: John Douglas Deibert: Innovator in Data Handling Evaluation

Introduction

John Douglas Deibert is a notable inventor based in Longmont, Colorado. He has made significant contributions to the field of data handling devices, particularly through his innovative patent.

Latest Patents

Deibert holds a patent titled "Evaluating data handling devices by means of a marker impurity." This invention presents a method for evaluating multiple data handling devices, each equipped with a sealed chamber containing various interior surfaces. The method utilizes an impurity chamber filled with thousands of dispersed gas-borne particles, each containing a marker impurity that is largely absent from the interior surfaces of at least one of the devices. This device is then tested for its vulnerability to external dust using the marker impurity.

Career Highlights

John Douglas Deibert is currently employed at Seagate Technology Incorporated, a leading company in data storage solutions. His work focuses on enhancing the reliability and performance of data handling devices through innovative evaluation methods.

Collaborations

Throughout his career, Deibert has collaborated with notable colleagues, including Ronald Lee Watts and Kenneth J. Altshuler. These collaborations have contributed to advancements in the field of data handling and evaluation.

Conclusion

John Douglas Deibert's innovative approach to evaluating data handling devices showcases his expertise and commitment to improving technology in this area. His contributions continue to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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