The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Nov. 30, 2001
Ronald Lee Watts, Ft. Collins, CO (US);
Kenneth J. Altshuler, Boulder, CO (US);
John Douglas Deibert, Longmont, CO (US);
Phillip S. Wilhelm, Longmont, CO (US);
Jonathan E. Olson, Boulder, CO (US);
Ronald Lee Watts, Ft. Collins, CO (US);
Kenneth J. Altshuler, Boulder, CO (US);
John Douglas Deibert, Longmont, CO (US);
Phillip S. Wilhelm, Longmont, CO (US);
Jonathan E. Olson, Boulder, CO (US);
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
The present invention is a method for evaluating a multiplicity of data handling devices each having a sealed chamber with several interior surfaces. It uses an impurity chamber containing thousands of dispersed gas-borne particles that each contain a marker impurity that is substantially absent from all of the interior surfaces of at least one of the devices. That device is tested for vulnerability to external dust using the marker impurity.