John David Alexander

Title: Innovations of John David Alexander

Introduction

John David Alexander is a notable inventor based in Tempe, AZ (US). He has made significant contributions to the field of probe-based technology, particularly in the development of methods for low-force profiling of sample surfaces. His work has implications for various scientific and industrial applications.

Latest Patents

John David Alexander holds a patent for a "Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory mode." This invention relates to a multi-purpose probe-based apparatus and methods for providing images of surface topography. It also includes the detection and quantitative mapping of local mechanical and electromagnetic properties in a non-resonant oscillatory mode. The methods involve filtering incoming probe signals, which provide time deflection curves used for controlling scanning and collecting data that reflects sample adhesion, stiffness, elastic modulus, and viscoelastic response, as well as electric and magnetic interactions. The invention allows for adaptive choice of an AFM's deflection set-point, enabling imaging at the contact repulsive force for precise surface profilometry. The stable thermal environment reduces apparatus thermal drift and enhances performance.

Career Highlights

John David Alexander is associated with Nt-MDT Development Inc., where he continues to innovate in the field of scanning probe microscopy. His work has been instrumental in advancing the capabilities of probe-based technologies.

Collaborations

He has collaborated with notable colleagues such as Serguei Magonov and Sergey Belikov, contributing to the advancement of their shared field of expertise.

Conclusion

John David Alexander's contributions to the field of probe-based technology highlight his innovative spirit and dedication to advancing scientific understanding. His patent reflects a significant step forward in the ability to analyze and map surface properties with precision.