Columbus, OH, United States of America

John D White, Iii


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: John D White, III: Innovator in Thermography Testing

Introduction

John D White, III is a notable inventor based in Columbus, OH (US). He has made significant contributions to the field of thermography testing, particularly in the evaluation of bonding integrity in sputtering targets. His innovative approach has led to the development of a unique method and apparatus that enhances the reliability of sputtering target assemblies.

Latest Patents

John D White, III holds a patent for a "Thermography test method and apparatus for bonding evaluation in sputtering targets." This patent describes a method that involves applying a heating or cooling medium to one surface of a sputtering target assembly. An imaging device is then used to acquire a graphic recording of the temperature changes on the opposing surface. The patent also details a mathematical analysis of the pixel data recorded in each frame, resulting in an integrated normalized temperature map that represents the bond integrity of the assembly. This innovative method is crucial for ensuring the quality and performance of sputtering targets in various applications.

Career Highlights

John D White, III is associated with Cabot Corporation, where he applies his expertise in thermography and bonding evaluation. His work at Cabot Corporation has allowed him to contribute to advancements in materials science and engineering. With a focus on innovation, he continues to push the boundaries of what is possible in his field.

Collaborations

Throughout his career, John has collaborated with esteemed colleagues such as Charles E Wickersham, Jr. and Zhiguo Zhang. These collaborations have fostered a productive environment for innovation and have led to significant advancements in their respective fields.

Conclusion

John D White, III is a pioneering inventor whose work in thermography testing has made a lasting impact on the evaluation of sputtering targets. His innovative methods and dedication to quality continue to influence the industry.

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