Tigard, OR, United States of America

John D Trudel

This inventor holds 1 USPTO granted patent. Top assignee: Tektronix, Inc.. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John D Trudel. Retrieved from https://idiyas.com/inventor/john-d-trudel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: Innovations of John D Trudel

Introduction

John D Trudel is an accomplished inventor based in Tigard, OR (US). He is known for his significant contributions to the field of waveform storage and display systems. His innovative approach has led to advancements that are particularly useful in digital oscilloscopes.

Latest Patents

Trudel holds a patent for a "Waveform storage and display system." This system is designed to compare successive waveforms of a repetitive signal with a reference waveform. Upon detecting a difference or change within the waveform, the system automatically stores the changed waveform. In addition to conventional acquisition and display waveform memories, it includes reference-waveform and changed-waveform memories. The system operates under microprocessor control, allowing for the selection and storage of reference waveforms. Various display modes can be implemented to visually indicate changes.

Career Highlights

John D Trudel has made a notable impact in his field through his work at Tektronix, Inc. His expertise in waveform technology has contributed to the development of advanced measurement instruments.

Collaborations

Trudel has collaborated with Thomas P Dagostino, further enhancing the innovative capabilities within his projects.

Conclusion

John D Trudel's work exemplifies the spirit of innovation in waveform technology, showcasing his dedication to advancing digital measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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