Perkasie, PA, United States of America

John D Bazzano

This inventor holds 2 USPTO granted patents. Top assignee: Sri International. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John D Bazzano. Retrieved from https://idiyas.com/inventor/john-d-bazzano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: John D. Bazzano and Laser Detection Innovation

Introduction

John D. Bazzano is an inventor associated with Perkasie, Pennsylvania, and SRI International. His patent work includes technologies for detecting laser signals using image sensors and optical upconversion.

Latest Patents

Bazzano’s listed patents include “Laser Detection Using Multiple Image Sensors” and “Measurement of a Laser Pulse Repetition Frequency Using Upconversion.” His portfolio includes 2 patents.

“Laser Detection Using Multiple Image Sensors” describes a system that combines a silicon-based image sensor with an upconversion layer of crystals and a second image sensor through a common beam splitter. An optical band-pass filter directs selected wavelengths to the upconversion layer, which converts them into wavelengths detectable by the silicon sensor’s pixels. The system also uses a pulse-repetition-frequency decoder to identify the frequency of a laser flash.

Career Highlights

Bazzano’s listed work connects optical sensing, image processing, and laser-signal analysis. His affiliation with SRI International places this work within an organization engaged in research and technology development.

Collaborations

Bazzano’s listed coworker is Namwoong Paik. The available information identifies this professional connection but does not specify their roles or the details of any joint work.

Conclusion

John D. Bazzano’s patent record highlights approaches to laser detection that use multiple image sensors and upconversion to analyze signals beyond the direct detection range of silicon-based sensors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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