St. Gallen, Switzerland

Johan Stigwall

This inventor holds 22 USPTO granted patents and 10 published patent applications and 21 EPO patents, primarily in Optical Measurement Systems. Top assignees: Hexagon Technology Center Gmbh, Hexagon Innovation Hub Gmbh, Leica Geosystems Ag. Active years: 2017-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Johan Stigwall. Retrieved from https://idiyas.com/inventor/johan-stigwall

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 22 

% Patents Active = 95.5

 

Average Co-Inventor Count = 3.2

ph-index = 4

Forward Citations = 52(Granted Patents)


Company Filing History:


Years Active: 2017-2026

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Areas of Expertise:
TOF Sensor
CMM
Shape from Shading
Liquid Lens
Panoramic Image Acquisition
Metrology
Laser Tracker
Structured Light Projection
Retroreflector
Additive Manufacturing
Optical Process Monitoring
Calibration
22 patents (USPTO):Explore Patents

Title: Johan Stigwall - Innovator in Metrology and Measurement Technologies

Introduction

Johan Stigwall is an accomplished inventor based in St. Gallen, Switzerland, with a remarkable portfolio of 18 patents. His innovations focus primarily on advanced measurement systems and metrology technologies which have significantly contributed to the fields of precision measurement and imaging.

Latest Patents

Stigwall's latest inventions showcase his expertise and innovative spirit. One of his notable patents is a **Measuring System with Panoramic Image Acquisition Functionality**. This system is engineered for acquiring three-dimensional measuring points and includes a base unit, a support unit, and various actuators for rotating components. It employs a complex array of units including emitting and receiving units, directed beams, and image sensors to capture detailed scenes.

Another significant patent is the **Metrology System**, which includes a target object, a metrology instrument, and a control unit designed for alignment and orientation tasks. This system utilizes a time-of-flight sensor for accurate distance measurements and processes point cloud data to create a digital representation of the target object, further enhancing the accuracy of metrology applications.

Career Highlights

Throughout his career, Stigwall has made notable contributions while working at **Hexagon Technology Center GmbH** and **Leica Geosystems AG**. His roles in these innovative firms have allowed him to lead the development of cutting-edge technologies and solutions in the measurement sector, gaining recognition for his impactful work.

Collaborations

Stigwall has collaborated with distinguished coworkers such as **Thomas Jensen** and **Zheng Yang**, further enriching his professional journey. These collaborations have fostered a shared vision for advancing measurement technologies and exploring new avenues within the field of metrology.

Conclusion

Johan Stigwall's contributions through his patents and collaborative work reflect a deep commitment to innovation in measurement and metrology. His inventions continue to influence various industries, underscoring the importance of precise measurement technologies in today's increasingly technical world.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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