The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
Dec. 09, 2022
Hexagon Technology Center Gmbh, Heerbrugg, CH;
HEXAGON TECHNOLOGY CENTER GMBH, Heerbrugg, CH;
Abstract
A metrology system comprising a target object, a metrology instrument and a control unit configured for controlling an alignment of the targeting unit and for deriving an orientation of the target object. The metrology instrument comprises a zoom objective, an illumination unit and a time-of-flight sensor comprising an array of pixels and capable of providing range data for each pixel of the array as point cloud data, the time-of-flight sensor provides the distance measuring device. The control unit comprises an object determination functionality which provides receiving the point cloud data provided by the time-of-flight sensor, deriving a digital representation of the target object by processing the point cloud data, comparing the digital representation of the target object with a reference pattern of the target object, and determining the orientation of the target object based on the comparison of the digital representation of the target object with the reference pattern.