New York, NY, United States of America

Joey McEnery

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Gemological Institute of America. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joey McEnery. Retrieved from https://idiyas.com/inventor/joey-mcenery

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Joey McEnery

Introduction

Joey McEnery is an accomplished inventor based in New York, NY (US). He has made significant contributions to the field of gemology through his innovative patent. His work focuses on enhancing the analysis of gemstones, which is crucial for both gemologists and consumers.

Latest Patents

Joey McEnery holds a patent for a system and method for surface analysis of gemstones. This patent involves capturing and analyzing reflectance images of facets on a gemstone under specific lighting and camera setups. The technology is designed to automatically generate a clarity grade and/or surface polish grade for the gemstone, providing valuable insights into its quality.

Career Highlights

McEnery is associated with the Gemological Institute of America, Inc., where he applies his expertise in gemology. His role at this prestigious institution allows him to contribute to the advancement of gemstone analysis and education.

Collaborations

Throughout his career, McEnery has worked alongside notable colleagues such as Tsung-Han Tsai and Hiroshi Takahashi. Their collaborative efforts have furthered the understanding and analysis of gemstones in the industry.

Conclusion

Joey McEnery's innovative work in gemstone analysis exemplifies the intersection of technology and gemology. His contributions are paving the way for more accurate assessments of gemstones, benefiting both professionals and consumers alike.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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