The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Jan. 12, 2023
Applicant:
Gemological Institute of America, Inc., Carlsbad, CA (US);
Inventors:
Tsung-Han Tsai, Maywood, NJ (US);
Hiroshi Takahashi, Fort Lee, NJ (US);
Joey McEnery, New York, NY (US);
Assignee:
Gemological Institute of America, Inc., Carlsbad, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/87 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/87 (2013.01); G01N 21/8851 (2013.01); G01N 2021/8864 (2013.01); G01N 2021/8887 (2013.01);
Abstract
Systems and methods here may be used for capturing and analyzing reflectance images of facets on a gemstone under particular lighting and camera setups to automatically generate a clarity grade and/or surface polish grade for the gemstone.
Tsai, Tsung-Han. (2025). Surface analysis of gemstones (U.S. Patent No. 12360049). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12360049
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile