Jena, Germany

Joerg Michael Funk

This inventor holds 1 USPTO granted patent. Top assignee: Carl Zeiss Microscopy Gmbh. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Joerg Michael Funk. Retrieved from https://idiyas.com/inventor/joerg-michael-funk-flw6222a

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Joerg Michael Funk: Innovator in Microscope Technology

Introduction

Joerg Michael Funk is a notable inventor based in Jena, Germany. He has made significant contributions to the field of microscopy, particularly through his innovative patent that enhances the functionality of laser scanning microscopes. His work is instrumental in advancing the capabilities of scientific imaging.

Latest Patents

Funk holds a patent titled "Method and arrangement for controlled actuation of a microscope, in particular of a laser scanning microscope." This invention outlines a method for actuation control of a microscope, where multiple illumination lights are utilized to enhance sample analysis. The patent emphasizes a controlled splitting of illumination light, prioritizing the intensity of the first light source to optimize imaging results.

Career Highlights

Joerg Michael Funk is associated with Carl Zeiss Microscopy GmbH, a leading company in the field of optical systems and microscopy. His role at the company has allowed him to collaborate with other experts in the field, contributing to advancements in microscopy technology.

Collaborations

Funk has worked alongside notable colleagues such as Ralf Engelmann and Bernhard Zimmerman. Their combined expertise has fostered a collaborative environment that promotes innovation in microscopy.

Conclusion

Joerg Michael Funk's contributions to microscopy through his patent and collaborative efforts highlight his role as a key innovator in the field. His work continues to influence advancements in scientific imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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