Joerg Huth

Title: Joerg Huth and His Patent for Scan-Chain Testing

Introduction

Joerg Huth is an inventor associated with Unterföhring, Germany, and LSI Logic Corporation. His patent work includes an invention addressing scan-chain testing in integrated circuits.

Latest Patents

Huth is associated with 1 patent: “Scan Chain Testing of Integrated Circuits with Hard-Cores.” The invention concerns an integrated circuit containing a hard-core and a peripheral circuit, each with registers that can be connected through scan-chain paths for testing. To help avoid timing problems between the paths, it uses a lock-up latch within the hard-core. The latch connects the final register in the hard-core scan chain to the first register in the peripheral circuit’s scan chain and uses the same clock signal as the hard-core’s final register.

Career Highlights

Huth’s listed patent is associated with LSI Logic Corporation and focuses on improving the coordination of scan-chain testing across integrated-circuit components.

Collaborations

Andreas Hils is identified as Huth’s coworker.

Conclusion

Joerg Huth’s patent describes a lock-up latch that helps address timing challenges when scan-chain testing connects a hard-core with a peripheral circuit.