Joerg Georg Appinger

Title: Joerg Georg Appinger: Innovator in Wafer Probe Alignment Technology

Introduction

Joerg Georg Appinger is a notable inventor based in Aidlingen, Germany. He has made significant contributions to the field of semiconductor testing, particularly in the area of wafer probe alignment. With a total of four patents to his name, Appinger's work has advanced the efficiency and accuracy of chip testing processes.

Latest Patents

One of Appinger's latest patents focuses on a wafer probe alignment system and method. This innovative system is designed for aligning a probe to a chip wafer for testing a chip on the wafer. The system allows for at least two corners of the probe to be adjustable in the same direction relative to a primary corner of the probe. The alignment approach includes providing a grid of signal pins that correspond to the contact pads of the chip under test. It determines whether an electrical contact is established with each signal pin and adjusts the position of the corners based on the results. This method ensures reliable electrical contact between the pins and the corresponding contact pads of the chip under test.

Career Highlights

Joerg Georg Appinger is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to collaborate with other talented professionals in the field, enhancing the development of innovative technologies.

Collaborations

Some of Appinger's notable coworkers include Michael Juergen Kessler and Manfred Schmidt. Their collaborative efforts contribute to the advancement of technology in the semiconductor industry.

Conclusion

Joerg Georg Appinger's contributions to wafer probe alignment technology exemplify his innovative spirit and dedication to improving semiconductor testing processes. His patents reflect a commitment to enhancing the efficiency and accuracy of chip testing, making a significant impact in the field.