The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
Jul. 30, 2003
Joerg Georg Appinger, Aidlingen, DE;
Michael Juergen Kessler, Herrenberg, DE;
Manfred Schmidt, Schoenaich, DE;
Joerg Georg Appinger, Aidlingen, DE;
Michael Juergen Kessler, Herrenberg, DE;
Manfred Schmidt, Schoenaich, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for efficiently coding test pattern for ICs in scan design and build-in linear feedback shift register (LFSR) for pseudo-random pattern generation. In an initialization procedure, a novel LFSR logic model is generated and integrated into the system for test data generation and test vector compression. In a test data generation procedure, test vectors are specified and compressed using the LFSR logic model. Every single one of the test vectors is compressed independently from the others. The result, however, may be presented all at once and subsequently provided to the user or another system for further processing or implementing in an integrated circuit to be tested. According to the present invention a test vector containing 0/1-values for, e.g., up to 500.000 shift registers and having, e.g., about 50 so called care-bits can be compressed to a compact pattern code of the number of care-bits, i.e., 50 bits for the example of 50 care-bits.