This inventor holds 1 USPTO granted patent. Top assignee: Daimler Chrysler Ag. Active years: 2005.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2005
Title: **Innovations in Surface Measurement: The Contributions of Joerg Baumgart**
Introduction
Joerg Baumgart, an innovative inventor based in Salem-Mimmenhausen, Germany, has made significant contributions to the field of surface measurement technology. With one patent to his name, his work embodies the intersection of precision engineering and advanced optical techniques.
Latest Patents
Baumgart's notable patent, titled "Measurement of small, periodic undulations in surfaces," introduces a sophisticated method and apparatus designed to detect minute periodic wave patterns in technical surfaces. The ingenuity of this invention lies in the use of monochromatic coherent primary light, strategically directed onto a workpiece surface. This method not only identifies the presence of a periodic wave pattern through the observation of intensity maxima, but also enables precise calculations of the period and depth of wave troughs via autocorrelation functions.
Career Highlights
Throughout his career, Joerg Baumgart has been associated with Daimler Chrysler AG, where he has further developed his skills and expertise in the realm of technical surface measurement. His background reflects a strong commitment to enhancing the capabilities of measurement techniques in industrial applications.
Collaborations
Baumgart has collaborated with esteemed colleagues such as Norbert Rau and Horst Truckenbrodt. Together, they have contributed to advancements in the field, sharing ideas and fostering innovation within their organization.
Conclusion
Joerg Baumgart's contributions to the field of surface measurement are notable not only for their technical merit but also for their practical applications in various industries. His innovative patent demonstrates how meticulous attention to detail can lead to significant advancements in technology, laying the groundwork for future developments in surface analysis and measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
