The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6914683 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 05, 2005

Filed:

Sep. 07, 1999
Applicants:

Joerg Baumgart, Salem-Mimmenhausen, DE;

Norbert Rau, Kirchheim, DE;

Horst Truckenbrodt, Ilmenau, DE;

Inventors:

Joerg Baumgart, Salem-Mimmenhausen, DE;

Norbert Rau, Kirchheim, DE;

Horst Truckenbrodt, Ilmenau, DE;

Assignee:

DaimlerChrysler AG, Stuttgart, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B011/02 ; G01B011/30 ; G01N021/00 ;
U.S. Cl.
CPC ...
Abstract

In a method and apparatus for detecting small periodic wave patterns in technical surfaces, monochromatic coherent primary light is directed onto a workpiece surface approximately at right angles to the expected periodic wave patterns, and at an angle of incidence that grazes the workpiece surface, creating a diffraction image of the waved surface structure in the secondary-light beam. The occurrence of two intensity maxima immediately indicates the presence of a periodic wave pattern, whose period is evaluated through inverse proportionality from the spacing of neighboring intensity maxima, while the depth of the wave troughs is determined from the intensity of neighboring intensity maxima and from the period. The intensity distribution in the diffraction image in the secondary-beam path is subjected to an autocorrelation, and both the period and the depth of the wave pattern can be calculated from the autocorrelation function.


Find Patent Forward Citations

Baumgart, Joerg. (2005). Measurement of small, periodic undulations in surfaces (U.S. Patent No. 6914683). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6914683

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…