Munich, Germany

Jochen Riedisser

This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Technology Solutions Gmbh. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jochen Riedisser. Retrieved from https://idiyas.com/inventor/jochen-riedisser-5p0o139h

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Jochen Riedisser: Innovator in Product Analysis Technology

Introduction

Jochen Riedisser is a notable inventor based in Munich, Germany. He has made significant contributions to the field of product analysis through his innovative methods and technologies. His work focuses on enhancing the accuracy and efficiency of defect detection in products.

Latest Patents

Jochen Riedisser holds a patent for a "Method and apparatus for analyzing a product, training method, system, computer program, and computer-readable storage medium." This patent describes a sophisticated method of analyzing a product by performing anomaly detection on received images using an autoencoder. The autoencoder is trained on a set of defect-free product images, allowing for precise identification of defects through a binary classifier and a defect detector.

Career Highlights

Jochen is currently employed at Fujitsu Technology Solutions GmbH, where he applies his expertise in product analysis. His innovative approach has positioned him as a key player in the development of advanced technologies that improve product quality assurance.

Collaborations

Jochen collaborates with talented individuals such as Felix Rothmund and Simran Agarwal. Their combined efforts contribute to the advancement of technology in product analysis.

Conclusion

Jochen Riedisser's work exemplifies the intersection of technology and innovation in product analysis. His contributions are paving the way for more effective quality control methods in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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