The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Jul. 19, 2022
Fujitsu Technology Solutions Gmbh, Munich, DE;
Felix Rothmund, Munich, DE;
Simran Agarwal, Munich, DE;
Leslie Casas, Munich, DE;
Keng Chai, Munich, DE;
Markus Bößl, Munich, DE;
Shweta Mahajan, Munich, DE;
Jonathan Pirnay, Munich, DE;
Jochen Riedisser, Munich, DE;
Fujitsu Technology Solutions GmbH, Munich, DE;
Abstract
A method of analyzing a product includes performing an anomaly detection on a received image using an autoencoder, wherein the autoencoder includes at least one first neural network trained based on a first set of training images, and the first set of training images includes a plurality of training images each showing a corresponding defect-free product; determining, using a binary classifier, whether or not a defect is present based on a result of the anomaly detection; performing defect detection on the received image using a defect detector, wherein the defect detector includes a third neural network trained based on a one third set of training images, and the third set of training images includes a plurality of training images each showing a corresponding defective product; and evaluating a result based on a weighting of the results of the anomaly detection, the defect detection, and the binary classifier.