Company Filing History:
Years Active: 2025
Title: Innovations by Jonathan Pirnay
Introduction
Jonathan Pirnay is an accomplished inventor based in Munich, Germany. He has made significant contributions to the field of product analysis through his innovative methods and technologies. His work focuses on utilizing advanced neural networks for defect detection and anomaly analysis.
Latest Patents
Jonathan Pirnay holds a patent for a "Method and apparatus for analyzing a product, training method, system, computer program, and computer-readable storage medium." This patent describes a method of analyzing a product that includes performing anomaly detection on a received image using an autoencoder. The autoencoder is trained based on a first set of training images that show defect-free products. The method also involves determining the presence of defects using a binary classifier and performing defect detection with a defect detector trained on images of defective products. The results are evaluated based on a combination of the anomaly detection, defect detection, and binary classifier outcomes. He has 1 patent to his name.
Career Highlights
Jonathan is currently employed at Fujitsu Technology Solutions GmbH, where he applies his expertise in product analysis and machine learning. His innovative approach has positioned him as a valuable asset in the technology sector.
Collaborations
He collaborates with talented coworkers, including Felix Rothmund and Simran Agarwal, to further enhance the capabilities of their projects and drive innovation within the company.
Conclusion
Jonathan Pirnay's contributions to product analysis through his patented methods demonstrate his commitment to innovation and excellence in technology. His work continues to influence the field and inspire future advancements.