This inventor holds 1 USPTO granted patent. Top assignee: Fei Comapny. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Jiří Benda: Innovator in Sample Handling for Charged Particle Microscopy
Introduction
Jiří Benda is a notable inventor based in Brno, Czech Republic. He has made significant contributions to the field of charged particle microscopy, particularly in the handling and storage of samples. His innovative approach has led to the development of a unique system that enhances the efficiency of sample management in advanced microscopy techniques.
Latest Patents
Jiří Benda holds a patent for a "System and method for handling samples for study in a charged particle apparatus, such as a transmission electron microscope." This invention relates to a sample handling and storage system designed for cryogenic samples used in charged particle microscopy. The system includes a storage apparatus for multiple samples and a Charged Particle Apparatus (CPA), such as a cryo-transmission electron microscope, located remotely from the storage apparatus. A transfer device is also included, which connects to both the storage apparatus and the CPA, facilitating the acquisition and transfer of samples.
Career Highlights
Jiří Benda is currently employed at FEI Company, where he continues to innovate in the field of microscopy. His work focuses on improving the methodologies used in sample handling, which is crucial for the advancement of electron microscopy techniques. His contributions have been instrumental in enhancing the capabilities of cryo-electron microscopy.
Collaborations
Throughout his career, Jiří has collaborated with talented individuals such as Vojtěch Doležal and Tomáš Trnkócy. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies in microscopy.
Conclusion
Jiří Benda's work in the field of charged particle microscopy exemplifies the importance of innovation in scientific research. His patented system for sample handling is a testament to his dedication to advancing microscopy techniques. His contributions continue to impact the scientific community positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile