Jinyu Tong

Title: Innovations by Jinyu Tong in Semiconductor Device Testing

Jinyu Tong is an accomplished inventor based in Wuhan, China. He has made significant contributions to the field of semiconductor device testing, showcasing his expertise through his innovative patent.

Latest Patents

Jinyu Tong holds a patent for "Methods and structures for semiconductor device testing." This patent describes a structure for performing analysis that includes a first opening formed on the back side of a substrate, which passes through the substrate. It also features a second opening connected with the bottom of the first opening, penetrating into a first dielectric layer formed on the front side of the substrate. The invention includes a first conductive layer formed on the sidewall of the second opening, a contact element in the first dielectric layer, and a second conductive layer formed on a second dielectric layer. The first conductive layer electrically contacts the second conductive layer. This innovative approach enhances the efficiency and accuracy of semiconductor device testing.

Career Highlights

Jinyu Tong is currently employed at Yangtze Memory Technologies Co., Ltd., where he continues to develop cutting-edge technologies in the semiconductor industry. His work has positioned him as a key player in advancing semiconductor testing methodologies.

Collaborations

Jinyu collaborates with talented coworkers, including Lin Qi and Xiaoqiong Du, who contribute to the innovative environment at Yangtze Memory Technologies Co., Ltd. Their combined efforts foster a culture of creativity and technological advancement.

Conclusion

Jinyu Tong's contributions to semiconductor device testing through his patent demonstrate his innovative spirit and commitment to advancing technology. His work at Yangtze Memory Technologies Co., Ltd. continues to influence the semiconductor industry positively.