Jinuk Byun

Title: Jinuk Byun - Innovator in Semiconductor Measurement Data Transformation

Introduction

Jinuk Byun is an inventor based in Suwon-si, South Korea. He is focused on developing innovative solutions in the field of semiconductor manufacturing. His work primarily revolves around transforming measurement data to enhance the efficiency and accuracy of semiconductor processes.

Latest Patent Applications

Jinuk Byun has submitted several notable patent applications, including:

1. **DEVICE, METHOD, AND SYSTEM FOR TRANSFORMING MEASUREMENT DATA** - This application relates to devices, methods, and systems for transforming measurement data. An example device includes a communicator configured to receive first measurement data, which includes step height values on a semiconductor chip that has undergone a chemical mechanical polishing (CMP) process. The device also receives layout data comprising a layout included in the semiconductor chip. A processor is configured to transform the first measurement data into second measurement data based on the layout data, which includes step height values of the semiconductor chip with a metal deposited thereon.

2. **OFFSET DATA CORRECTION METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD INCLUDING THE SAME** - This application describes an offset data correction method that involves measuring a measurement target that has undergone a CMP process. It generates an offset correction model based on the measurement of the target and uses this model to correct measured data obtained from the measurement. The offset correction model is trained using the measured data and layout data of the measurement target as inputs.

Conclusion

Jinuk Byun is making significant strides in the semiconductor industry through his innovative patent applications. His focus on transforming measurement data and correcting offset data showcases his commitment to advancing semiconductor manufacturing technologies.