This inventor holds 1 USPTO granted patent. Top assignees: Mettler Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Jinli Li - Innovator in Eccentric Load Error Correction
Introduction
Jinli Li is a notable inventor based in Changzhou, China. He has made significant contributions to the field of measurement technology, particularly in the area of weighing devices. His innovative approach to error correction has the potential to enhance the accuracy of weight measurements.
Latest Patents
Jinli Li holds a patent for a "Method and system for eccentric load error correction." This invention involves obtaining a plurality of weighing data sets for a weight with a specific mass value, which is loaded at different positions on a weighing platform. The method calculates differences between each weighing data set and the average value or mass value, allowing for the calculation and updating of sensor correction coefficients. This process continues until all differences are within a pre-set threshold, ensuring precise measurements.
Career Highlights
Throughout his career, Jinli Li has worked with Mettler Toledo Measurement Technology Ltd. and Mettler Toledo Precision Instruments Ltd. These companies are known for their advanced measurement solutions, and his experience there has contributed to his expertise in the field.
Collaborations
Jinli Li has collaborated with several professionals, including Shenhui Wang and Yujuan Zha. Their teamwork has likely fostered innovative ideas and advancements in measurement technology.
Conclusion
Jinli Li's work in eccentric load error correction exemplifies the importance of innovation in measurement technology. His contributions not only enhance the accuracy of weighing devices but also reflect the collaborative spirit of the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile