The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Jul. 08, 2021
Mettler-toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-toledo (Changzhou) Precision Instruments Ltd., Changzhou, CN;
Mettler-toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Shenhui Wang, Changzhou, CN;
Yujuan Zha, Changzhou, CN;
Song Zhang, Changzhou, CN;
Genjun Ji, Changzhou, CN;
Qiang Fu, Changzhou, CN;
Jinkang Han, Changzhou, CN;
Jinli Li, Changzhou, CN;
Mettler-Toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-Toledo (Changzhou) Precision Instruments Ltd., Changzhou, CN;
Mettler-Toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
Methods and systems for eccentric load error correction are disclosed. A plurality of weighing data sets for a weight having a mass value are obtained, where the weight is loaded at different positions on a weighing platform of a weighing device. Differences between each of the weighing data sets and the average value of the plurality of weighing data sets or the mass value of the weight are calculated. Sensor correction coefficients are calculated and updated when the maximum absolute value of the differences exceeds a pre-set threshold. The weighing data sets are updated. The above steps are repeated until the absolute values of all the differences are less than the pre-set threshold.