Seoul, South Korea

Jinhyo Jung

This inventor holds 2 USPTO granted patents. Top assignees: Samsung Electronics Ltd., Yonsei University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jinhyo Jung. Retrieved from https://idiyas.com/inventor/jinhyo-jung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Jinhyo Jung - Innovator in Processor Error Detection

Introduction

Jinhyo Jung is an inventor based in Seoul, South Korea. He is known for his contributions to the field of processor technology, particularly in the area of error detection. Although he currently holds no granted patents, his innovative ideas are reflected in his latest patent applications.

Latest Patent Applications

Jinhyo Jung has submitted several notable patent applications. One of his applications is titled "PROCESSOR AND METHOD OF DETECTING SOFT ERROR FROM PROCESSOR." This invention describes a processor that includes an instruction pipeline for processing both an original instruction and a duplicate instruction. The original register file stores results from the original instruction, while the duplicate register file does the same for the duplicate instruction. A comparing unit is included to compare the results and output an error detection signal based on a control signal.

Another application is titled "PROCESSOR AND METHOD OF DETECTING SOFT ERROR USING THE SAME." This method involves copying an original branch command to a copied branch command within a program loaded into memory. The processor executes both command sets and determines if an error exists in the execution of the original branch command based on the results from both sets.

Conclusion

Jinhyo Jung is an innovative inventor whose work focuses on enhancing processor reliability through error detection methods. His latest patent applications demonstrate his commitment to advancing technology in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…