The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Sep. 05, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Taesun Kim, Suwon-si, KR;

Jinhong Park, Suwon-si, KR;

Hwisoo So, Seoul, KR;

Kyoungwoo Lee, Seoul, KR;

Jinhyo Jung, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/1497 (2026.01); H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1497 (2013.01); H03M 13/1111 (2013.01);
Abstract

The method of detecting a soft error includes copying, in a program loaded into a memory, an original branch command to a copied branch command, executing, by a processor, a first command set comprising the copied branch command, executing, by a processor, a second command set comprising the original branch command, and determining, by a soft error detection circuit, whether an error exists in the execution of the original branch command based on the execution result of the first command set and the second command set.


Find Patent Forward Citations

Kim, Taesun. (2026). Processor and method of detecting soft error using the same (U.S. Patent No. 12602297). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12602297

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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