Company Filing History:
Years Active: 2015-2017
Title: Innovations of Jingyi Xiong
Introduction
Jingyi Xiong is a notable inventor based in Sunnyvale, CA (US). He has made significant contributions to the field of substrate inspection systems, holding a total of 2 patents. His work focuses on enhancing the precision and efficiency of wafer inspection processes.
Latest Patents
Jingyi Xiong's latest patents include a "Method and system for simultaneous tilt and height control of a substrate surface in an inspection system." This innovative system features a dynamically actuatable substrate stage assembly that secures a substrate and includes a tilt-height detection system. The system is equipped with actuators that allow for precise control of the substrate's position, ensuring optimal focus during inspections.
Another significant patent is the "Method and system for high speed height control of a substrate surface within a wafer inspection system." This invention involves positioning a substrate on a substrate stage and measuring height error values to maintain the substrate surface at the imaging plane of a detector. This advancement greatly improves the speed and accuracy of wafer inspections.
Career Highlights
Jingyi Xiong is currently employed at Kla Tencor Corporation, a leader in the field of semiconductor inspection and metrology. His work at the company has been instrumental in developing cutting-edge technologies that enhance the performance of inspection systems.
Collaborations
Jingyi collaborates with talented individuals such as Zhongping Cai and Tyler Trytko, contributing to a dynamic team focused on innovation in substrate inspection technologies.
Conclusion
Jingyi Xiong's contributions to the field of substrate inspection systems through his patents and work at Kla Tencor Corporation highlight his role as a key innovator in the industry. His advancements continue to push the boundaries of technology in wafer inspection.