This inventor holds 1 USPTO granted patent. Top assignee: Shanxi University. Active years: 2023.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2023
Title: Innovations of Jingxu Bai in Microwave Electric Field Measurement
Introduction
Jingxu Bai is a notable inventor based in Taiyuan, China. He has made significant contributions to the field of microwave electric field measurement. His innovative work focuses on utilizing Rydberg atoms to enhance measurement techniques.
Latest Patents
Jingxu Bai holds a patent for an "Apparatus and method for measuring microwave electric field at continuous frequencies based on alternating current (AC) Stark effect of Rydberg atoms." This invention involves a cesium vapor cell as an atomic sample cell. The method excites a cesium atom to a Rydberg state using detection light and coupling light from two laser sources. The process generates an electromagnetically induced transparency spectrum. A strong electric field is applied to cause AC Stark frequency shifts and splitting of the Rydberg energy level. The Rydberg atom acts as a frequency converter, allowing for direct reading of the beat frequency signal of the local field and the signal field. This innovative approach enables the direct measurement of the strength of the signal field.
Career Highlights
Jingxu Bai is affiliated with Shanxi University, where he continues to advance research in his field. His work has garnered attention for its potential applications in various scientific and technological domains.
Collaborations
Jingxu Bai collaborates with esteemed colleagues, including Yuechun Jiao and Jianming Zhao. Their combined expertise contributes to the advancement of research in microwave measurement techniques.
Conclusion
Jingxu Bai's innovative contributions to microwave electric field measurement demonstrate the potential of Rydberg atoms in enhancing measurement accuracy. His work continues to influence the field and inspire future research endeavors.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile