The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2023

Filed:

Jul. 15, 2022
Applicant:

Shanxi University, Taiyuan, CN;

Inventors:

Yuechun Jiao, Taiyuan, CN;

Jianming Zhao, Taiyuan, CN;

Jingxu Bai, Taiyuan, CN;

Assignee:

Shanxi University, Taiyuan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/12 (2006.01);
U.S. Cl.
CPC ...
G01R 29/12 (2013.01);
Abstract

An apparatus and a method for measuring a microwave electric field at continuous frequencies based on an alternating current (AC) Stark effect of Rydberg atoms. A cesium vapor cell is used as an atomic sample cell. A cesium atom is excited to a Rydberg state by using detection light and coupling light that are emitted by two laser light sources, an electromagnetically induced transparency spectrum is generated. Further, a strong electric field is used as a local field EL, to cause AC Stark frequency shift and splitting of a Rydberg energy level. Eof to-be-detected signal electric field is applied. In this case, the Rydberg atom serves as a frequency converter, to directly read a beat frequency signal Δf of the local field and the signal field. From the beat signal, the strength of Eof signal filed can be directly read out.


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