This inventor holds 1 USPTO granted patent. Top assignee: Shanxi University. Active years: 2023.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2023
Title: Innovations of Jianming Zhao in Microwave Electric Field Measurement
Introduction
Jianming Zhao is a prominent inventor based in Taiyuan, China. He has made significant contributions to the field of microwave electric field measurement. His innovative work focuses on utilizing Rydberg atoms to enhance measurement techniques.
Latest Patents
Jianming Zhao holds a patent for an "Apparatus and method for measuring microwave electric field at continuous frequencies based on alternating current (AC) Stark effect of Rydberg atoms." This invention involves an apparatus and method that employs a cesium vapor cell as an atomic sample. The cesium atom is excited to a Rydberg state using detection and coupling light from two laser sources. The process generates an electromagnetically induced transparency spectrum. A strong electric field is applied to induce an AC Stark frequency shift and splitting of the Rydberg energy level. The Rydberg atom acts as a frequency converter, allowing for the direct reading of the beat frequency signal of the local field and the signal field. This innovative approach enables the direct measurement of the strength of the signal field.
Career Highlights
Jianming Zhao is affiliated with Shanxi University, where he continues to advance research in his field. His work has garnered attention for its practical applications in measuring electric fields with high precision.
Collaborations
Jianming has collaborated with notable colleagues, including Yuechun Jiao and Jingxu Bai, contributing to the advancement of research in microwave measurement techniques.
Conclusion
Jianming Zhao's innovative patent and contributions to the field of microwave electric field measurement highlight his role as a leading inventor. His work not only enhances measurement techniques but also paves the way for future advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile