Tokyo, Japan

Jingwen Lu

This inventor holds 1 USPTO granted patent and 11 published patent applications. Top assignee: Nec Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jingwen Lu. Retrieved from https://idiyas.com/inventor/jingwen-lu-qvgl214n

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jingwen Lu: Innovator in Fatigue Estimation Technology

Introduction

Jingwen Lu is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of fatigue estimation technology. Her innovative work focuses on developing devices and methods that enhance the understanding of fatigue levels in individuals.

Latest Patents

Jingwen Lu holds a patent for a "Fatigue estimation device, fatigue estimation method, and storage medium." This invention includes a normalization process that utilizes biological data to assess the fatigue level of a test subject. The device aims to provide accurate fatigue estimations, which can be crucial in various applications, including healthcare and performance monitoring.

Career Highlights

Jingwen Lu is associated with NEC Corporation, where she applies her expertise in technology and innovation. Her work at NEC Corporation has allowed her to explore advanced solutions in fatigue estimation, contributing to the company's reputation as a leader in technological advancements.

Collaborations

Jingwen collaborates with notable colleagues, including Tasuku Kitade and Masanori Tsujikawa. These partnerships enhance her research and development efforts, fostering a collaborative environment that drives innovation.

Conclusion

Jingwen Lu's contributions to fatigue estimation technology exemplify her dedication to innovation and research. Her patent and work at NEC Corporation highlight her role as a leading inventor in this important field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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