The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Jun. 01, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Jingwen Lu, Tokyo, JP;

Tasuku Kitade, Tokyo, JP;

Masanori Tsujikawa, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/7275 (2013.01);
Abstract

In a fatigue estimation device mainly includes a normalization process meansX, and a fatigue estimation meansX. The normalization process meansX performs a normalization process based on an attribute of a test subject with respect to biological data of the test subject. The fatigue estimation meansX estimates a fatigue level of the test subject based on the biological data after the normalization process.


Find Patent Forward Citations

Lu, Jingwen. (2026). Fatigue estimation device, fatigue estimation method, and storage medium (U.S. Patent No. 12678106). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12678106

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…