Shenzhen, China

Jinguo Zhou

This inventor holds 1 USPTO granted patent. Top assignee: Shenzhen Qianhai Sourcebrella Inc. Ltd.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jinguo Zhou. Retrieved from https://idiyas.com/inventor/jinguo-zhou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Jinguo Zhou: Innovator in Software Defect Detection

Introduction

Jinguo Zhou is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of software engineering, particularly in the area of defect detection. His innovative approach has led to the development of a unique method for identifying defects in computer software code.

Latest Patents

Jinguo Zhou holds a patent for a "Defect detection method, device, system and computer readable medium." This method involves preprocessing code to check for defects, generating a Software Execution Graph (SEG) that includes nodes and edges representing data and control dependencies. The process includes traversing the SEG in a depth-first manner to identify defects and generate bug reports when issues are found. He has 1 patent to his name.

Career Highlights

Jinguo Zhou is currently employed at Shenzhen Qianhai Sourcebrella Inc. Ltd., where he continues to innovate in software defect detection. His work has been instrumental in improving the reliability and quality of software products.

Collaborations

Some of his notable coworkers include Xiao Xiao and Qingkai Shi, who contribute to the collaborative environment at Shenzhen Qianhai Sourcebrella Inc. Ltd.

Conclusion

Jinguo Zhou's contributions to software defect detection exemplify the importance of innovation in technology. His patented methods are paving the way for more reliable software development practices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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