The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2020
Filed:
Aug. 31, 2018
Shenzhen Qianhai Sourcebrella Inc. Ltd., Shenzhen, CN;
Xiao Xiao, Shenzhen, CN;
Qingkai Shi, Shenzhen, CN;
Jinguo Zhou, Shenzhen, CN;
Gang Fan, Shenzhen, CN;
SHENZHEN QIANHAI SOURCEBRELLA INC. LTD., Shenzhen, CN;
Abstract
A method for detecting defects in computer software code comprises: preprocessing a code to check; generating an SEG for the code to check, wherein the SEG includes nodes, data dependency edges and control dependency edges that connect the nodes, wherein, the nodes include value nodes and operator nodes, the value nodes including terminal value nodes representing unknown values or constants generated outside a function, and non-terminal value node representing values generated within the function, wherein each non-terminal value node is associated with a unique memory location, and wherein the data dependency edge is a directed edge connecting a value node to another value node that has a direct data dependency relationship with the value node, and traversing the SEG in a depth-first way backward from a null pointer node in a lowest level of the SEG and generating a bug report when a defect is found.