Bear, DE, United States of America

Jingkun Li

This inventor holds 1 USPTO granted patent. Top assignee: Strategic Diagnostics Inc.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jingkun Li. Retrieved from https://idiyas.com/inventor/jingkun-li-qbrc7643

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jingkun Li

Introduction

Jingkun Li is an accomplished inventor based in Bear, Delaware. He has made significant contributions to the field of analytical chemistry through his innovative patent. His work focuses on enhancing the detection and confirmation of analytes, which is crucial in various applications, including food safety.

Latest Patents

Jingkun Li holds a patent for "Isolation and confirmation of analytes from test devices." This patent outlines methods, articles, and kits designed to obtain elevated concentrations of a substance from a sample that has become bound. This process is particularly useful in immunoassays or other binding assays. The concentrated substance can be subjected to further processing or analysis to confirm its identity, such as identifying pathogenic organisms in food samples.

Career Highlights

Jingkun Li is associated with Strategic Diagnostics Inc., where he applies his expertise in developing innovative solutions for analytical challenges. His work at the company has contributed to advancements in the field, particularly in improving testing methods for various substances.

Collaborations

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Conclusion

Jingkun Li's contributions to the field of analytical chemistry through his patent and work at Strategic Diagnostics Inc. highlight his role as an innovative inventor. His efforts in enhancing analyte detection methods are vital for ensuring safety and accuracy in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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