Newark, DE, United States of America

Strategic Diagnostics Inc.


USPTO Granted Patents = 18

% Expired Patents = 16.7


Trademarks = 8

Forward Citations = 89

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36 inventors (with patents filed for the assignee):

goldMedal James W Stave (6 out of 9 patents)

silverMedal Fernando Manuel Rubio (2 out of 11 patents)

bronzeMedal Dale V Onisk (2 out of 3 patents)

4.  Pauline Weatherby (2 out of 2 patents)

5.  William Howard Stimson (2 out of 10 patents)

6.  Robert T Hudak (2 out of 2 patents)

7.  Michael Brown (1 out of 5 patents)

8.  Dong Chen (1 out of 8 patents)

9.  Robert L Wetegrove (1 out of 17 patents)

10.  Matthew H Knight (1 out of 1 patent)

11.  George B Teaney, Iii (1 out of 2 patents)

12.  Tara Ann Kennedy (1 out of 1 patent)

13.  Alan Bruce McQuillin (1 out of 1 patent)

14.  Jingkun Li (1 out of 1 patent)

15.  Colin Cooper (1 out of 1 patent)


18 patents:

Company Overview
Strategic Diagnostics Inc., based in Newark, Delaware, specializes in the development and manufacturing of innovative diagnostic solutions. The company focuses on providing advanced technologies for various applications, including environmental monitoring, food safety, and clinical diagnostics. With a commitment to enhancing detection capabilities, Strategic Diagnostics leverages its expertise in immunoassay and molecular technologies to deliver reliable and efficient testing solutions that address critical industry needs.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

18 Patents

#18 in Newark, DE

#289 in Delaware

#17,974 in US

#34,244 in the World

Newark, DE (US)
Newark, DE, United States of America
Forward Citations = 89

36 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Strategic Diagnostics Inc.. Retrieved from https://idiyas.com/company/strategic-diagnostics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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