Company Filing History:
Years Active: 2003
Title: Inventor Jing Pan: Innovating Thin Film Measurement Techniques
Introduction: Jing Pan is a distinguished inventor based in Nashua, NH, USA, known for his innovative contributions to the field of optical thin films. With a patent to his name, he has made significant strides in the advancement of measurement techniques critical for various applications.
Latest Patents: Jing Pan holds a patent for an "In-situ thickness and refractive index monitoring and control system for thin film deposition." This revolutionary method involves generating a diagnostic light beam with two distinct wavelengths and measuring unattenuated and attenuated light intensities. By determining the null light intensity and solving normalized intensity functions, the thickness and refractive index of optical thin films can be accurately determined. This technology is vital for industries reliant on precise thin film applications.
Career Highlights: Currently employed at Unaxis USA Inc., Jing Pan has been pivotal in developing new methodologies that enhance the accuracy and efficiency of thin film deposition processes. His dedication to innovation in optical technologies is evident in his successful patent, reflecting his commitment to advancing the field.
Collaborations: Throughout his career, Jing has worked closely with his coworker, Jian Zhang. Their collaboration has led to advancements in thin film technologies, pooling their expertise to push the boundaries of optical measurements and control systems.
Conclusion: Jing Pan’s work exemplifies the spirit of innovation, contributing valuable techniques to the realm of thin film deposition. His patent not only showcases his individual talents but also highlights the potential impact of collaborative efforts in driving technological advancements. With a promising career ahead, Jing Pan will undoubtedly continue to influence the landscape of optical engineering.