This inventor holds 4 USPTO granted patents, plus 1 CIPO patent and 1 EPO patent. Top assignees: Horizon Journey (Hangzhou) Artificial Intelligence Technology Co., Ltd., Sunon Technology Co., Ltd, University of Nottingham Ningbo China. Active years: 2024-2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024-2025
Title: Jing Li - Innovator in Testing Circuits
Introduction
Jing Li is a prominent inventor based in Zhejiang, China. He has made significant contributions to the field of testing circuits, holding a total of 4 patents. His innovative work focuses on enhancing the efficiency and reliability of testing modules.
Latest Patents
One of Jing Li's latest patents is a test circuit, method, and apparatus for a to-be-tested module. This invention includes a test data generation module with multiple units designed to generate test data consistent with specific data types. The functional safety module is electrically connected to the to-be-tested module and each test data generation unit. It performs check operation processing on the test data to obtain a first processing result and conducts fault injection processing to achieve a second processing result. This invention allows for multi-channel testing, meeting the application requirements for processing multi-channel inputs.
Career Highlights
Throughout his career, Jing Li has worked with notable companies such as Horizon Journey Artificial Intelligence Technology Co., Ltd. and Sunon Technology Co., Ltd. His experience in these organizations has contributed to his expertise in the field of testing circuits.
Collaborations
Jing Li has collaborated with talented individuals like Luyang Zhang and Yi Zhou, further enhancing his innovative projects and contributions to the industry.
Conclusion
Jing Li's work in testing circuits showcases his dedication to innovation and improvement in technology. His patents reflect a commitment to advancing the field and addressing the challenges of multi-channel testing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile