The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Mar. 30, 2022
Horizon Journey (Hangzhou) Artificial Intelligence Technology Co., Ltd., Zhejiang, CN;
Abstract
Disclosed are a test circuit, method, and apparatus for a to-be-tested module. The circuit includes a test data generation module including a plurality of test data generation units, each of which is configured to generate test data consistent with a data type supported by itself based on raw data consistent with the data type; and a functional safety module electrically connected to the to-be-tested module and each test data generation unit; the functional safety module being configured to perform check operation processing on the test data to obtain a first processing result, and to perform check operation processing and fault injection processing on the test data to obtain a second processing result; and the to-be-tested module being configured to generate a test result based on test data, first processing result, and second processing result. Embodiments of this disclosure can achieve multi-channel testing, thereby satisfying application requirement for processing multi-channel inputs.