This inventor holds 1 USPTO granted patent. Top assignee: Educational Testing Service. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021
Title: Innovations by Jing Chen in Automated Scoring Systems
Introduction
Jing Chen is an accomplished inventor based in Princeton, NJ (US). She has made significant contributions to the field of automated scoring systems, particularly in the context of educational assessments. Her innovative work focuses on improving the accuracy and reliability of scoring constructed responses.
Latest Patents
Jing Chen holds a patent for "Systems and methods for treatment of aberrant responses." This patent outlines systems and methods that automatically score responses and statistically reevaluate whether they can be considered aberrant. The invention includes a pre-screening stage that assesses constructed responses based on various aberration metrics and criteria. If a response is deemed acceptable, a post-hoc screening stage predicts discrepancies between scores assigned by automated systems and human raters. This dual-stage approach enhances the scoring process and ensures that responses requiring further review are flagged appropriately. She has 1 patent to her name.
Career Highlights
Jing Chen is currently employed at Educational Testing Service, where she applies her expertise in developing innovative assessment solutions. Her work has been instrumental in advancing the field of educational measurement and evaluation.
Collaborations
Jing collaborates with talented colleagues, including Mo Zhang and Andre Alexander Rupp, to further enhance the capabilities of automated scoring systems.
Conclusion
Jing Chen's contributions to the field of automated scoring systems demonstrate her commitment to improving educational assessments. Her innovative patent reflects her dedication to enhancing the accuracy and reliability of scoring methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
