The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Dec. 18, 2015
Educational Testing Service, Princeton, NJ (US);
Mo Zhang, Plainsboro, NJ (US);
Jing Chen, Princeton, NJ (US);
Andre Alexander Rupp, Princeton, NJ (US);
David Michael Williamson, Yardley, PA (US);
Educational Testing Service, Princeton, NJ (US);
Abstract
Systems and methods are provided for automatically scoring a response and statistically revaluating whether it can be considered as aberrant. In one embodiment, a constructed response is evaluated via a pre-screening stage and a post-hoc screening stage. The pre-screening stage attempts to determine whether the constructed response is aberrant based on a variety of aberration metrics and criteria. If the constructed response is deemed not to be aberrant, then the post-hoc screening stage attempts to predict a discrepancy between what score an automated scoring system would assigned and what score a human rater would assign to the response. If the discrepancy is sufficiently low, then the constructed response may be scored by an automated scoring engine. On the other hand, if the constructed response failed to pass either of the two stages, then a flag may be raised to indicate that additional human review may be needed.