Seoul, South Korea

Jin Hee Oh

This inventor holds 1 USPTO granted patent. Top assignee: Vieworks Co., Ltd.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jin Hee Oh. Retrieved from https://idiyas.com/inventor/jin-hee-oh-m31rn78q

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2022

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Jin Hee Oh - Innovator in Display Device Analysis

Introduction

Jin Hee Oh is a prominent inventor based in Seoul, South Korea. She has made significant contributions to the field of display technology. Her innovative work focuses on systems that enhance the analysis of display devices.

Latest Patents

Jin Hee Oh holds a patent for a "System for analyzing display device and color analyzing method thereof." This patent discloses a system that includes an image photographing device. The device photographs an image output from a display device and obtains an RGB value for inspection. An inspection control unit then converts this RGB value into a CIE XYZ value using a pre-prepared color conversion function. This process allows for the determination of defects in the display device being inspected.

Career Highlights

Jin Hee Oh is currently employed at Vieworks Co., Ltd., where she continues to develop her expertise in display technology. Her work has been instrumental in advancing methods for analyzing display devices.

Collaborations

Jin Hee Oh collaborates with talented coworkers, including Seung Hyun Kim and Gi Ryong Choi. Their combined efforts contribute to the innovative projects at Vieworks Co., Ltd.

Conclusion

Jin Hee Oh is a key figure in the field of display device analysis, with her patent showcasing her innovative approach to technology. Her contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…