The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2022
Filed:
Apr. 08, 2021
Applicant:
Vieworks Co., Ltd., Anyang-si, KR;
Inventors:
Seung Hyun Kim, Seongnam-si, KR;
Gi Ryong Choi, Gunpo-si, KR;
Jin Hee Oh, Seoul, KR;
Yoon Hyuk Lee, Uiwang-si, KR;
Assignee:
VIEWORKS CO., LTD., Anyang-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/88 (2006.01); G09G 3/20 (2006.01); G09G 3/3225 (2016.01);
U.S. Cl.
CPC ...
G01N 21/274 (2013.01); G01N 21/8851 (2013.01); G09G 3/2003 (2013.01); G01N 2021/8887 (2013.01); G09G 3/3225 (2013.01); G09G 2320/0693 (2013.01);
Abstract
Disclosed is a system for analyzing a display device, the system including: an image photographing device configured to photograph an image for inspection output from a display device to be inspected and obtain an RGB value for inspection from the photographed image; and an inspection control unit configured to convert the RGB value for inspection into a CIE XYZ value by using a previously prepared color conversion function, and determine defect of the display device to be inspected by using the converted CIE XYZ value.