This inventor holds 1 USPTO granted patent and 2 published patent applications and 1 EPO patent. Top assignee: Asml Netherlands B.v.. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Jill Elizabeth Freeman: Innovator in Process Window Modeling
Introduction
Jill Elizabeth Freeman is a notable inventor based in San Jose, CA (US). She has made significant contributions to the field of patterning processes through her innovative patent. Her work focuses on improving the reliability and efficiency of manufacturing processes.
Latest Patents
Jill holds a patent for a method titled "Process window based on a failure rate model." This invention involves determining a process window of a patterning process based on a failure rate. The method includes obtaining a plurality of features printed on a substrate, grouping the features based on a metric, and generating a base failure rate model for the group of features. This model identifies the process window related to the failure rate of the group. Additionally, the method allows for the generation of a feature-specific failure rate model, ensuring that the estimated failure rate of a specific feature remains below a specified threshold. Jill has 1 patent to her name.
Career Highlights
Jill is currently employed at ASML Netherlands B.V., a leading company in the semiconductor industry. Her role involves collaborating with other experts to enhance the efficiency of manufacturing processes.
Collaborations
One of her notable coworkers is Sudharshanan Raghunathan, with whom she collaborates on various projects related to process optimization.
Conclusion
Jill Elizabeth Freeman's innovative work in process window modeling showcases her expertise and commitment to advancing technology in the semiconductor industry. Her contributions are vital for improving manufacturing processes and ensuring product reliability.