Jie Du

Title: Innovations by Jie Du

Introduction

Jie Du is a notable inventor based in Santa Clara, CA (US). He has made significant contributions to the field of buffer management and memory testing, holding a total of 6 patents. His work has advanced the efficiency and functionality of memory systems.

Latest Patents

One of Jie Du's latest patents is titled "Unlimited sub-segment support in a buffer manager." This invention describes a system and method of buffer management that utilizes a common data structure recognizable by both hardware and firmware. The implementation of this common data structure in external memory reduces hardware real estate and complexity in buffer manager ASICs. It allows for the expansion of buffer sub-segments, limited only by the size of the external memory.

Another significant patent is "Automated scan testing of DDR SDRAM." This invention involves a controller designed for scan testing memory. The controller features a control state machine that manages the scan process, a test sequence stored in RAM, and a pattern generation data unit. It operates in various modes, including a periodic burst mode to conserve power, ensuring that memory testing does not interfere with other processes.

Career Highlights

Jie Du is currently employed at Marvell International Limited, where he continues to innovate in the field of memory technology. His work has been instrumental in developing advanced memory management systems that enhance performance and reliability.

Collaborations

Jie Du has collaborated with several talented individuals, including Jitendra Kumar Swarnkar and Vincent M Wong. These collaborations have contributed to the successful development of his innovative patents.

Conclusion

Jie Du's contributions to buffer management and memory testing exemplify the impact of innovation in technology. His patents reflect a commitment to advancing the efficiency and functionality of memory systems.