This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Beijing Changcheng Institute of Metrology & Measurement, Avic. Active years: 2024-2026.
Company Filing History:
Years Active: 2024-2026
Title: Jibo Han: Innovator in Photonic Measurement Technologies
Introduction
Jibo Han is a prominent inventor based in Beijing, China. He has made significant contributions to the field of photonic measurement technologies, holding two patents that showcase his innovative approach to high-speed measurement systems.
Latest Patents
One of Jibo Han's latest patents is a Photonic Doppler Velocimetry (PDV) system for ultra-high-speed instantaneous measurement. This system relates to laser velocity interferometry and includes a laser velocity interferometry module, a microwave photonic module, and a data acquisition and signal processing module. The components of the PDV system work together to achieve high-precision measurements.
Another notable patent is a high-precision rotation speed measurement method based on a femtosecond optical frequency comb. This method involves aligning the rotation axis of the object with the optical path main axis and utilizing a converging lens to focus the laser beam on the rotating object's surface. The method ensures accurate measurement by locking the repetition frequency and carrier-envelope offset frequency during the process.
Career Highlights
Jibo Han is currently employed at the Beijing Changcheng Institute of Metrology and Measurement, which is part of AVIC. His work at this institute has allowed him to develop cutting-edge technologies that enhance measurement accuracy in various applications.
Collaborations
Jibo Han has collaborated with notable colleagues, including Chuanqing Xia and Tengfei Wu. Their combined expertise contributes to the advancement of measurement technologies in their field.
Conclusion
Jibo Han's innovative work in photonic measurement technologies has positioned him as a key figure in the industry. His patents reflect a commitment to advancing measurement techniques, making significant contributions to the field.